Si4455
Table 7. Digital IO Specifications (GPIO_x, SCLK, SDO, SDI, nSEL, nIRQ) 1
Rise Time
Parameter
Symbol
T RISE
Test Condition
0.1 x V DD to 0.9 x V DD ,
Min
Typ
2.3
Max
Unit
ns
C L = 10 pF, DRV<1:0> = LL
V DD = 3.3 V
Fall Time
T FALL
0.9 x V DD to 0.1 x V DD,
2
ns
C L = 10 pF, DRV<1:0> = LL
V DD = 3.3 V
Input Capacitance
Logic High Level Input Voltage
Logic Low Level Input Voltage
C IN
V IH
V IL
V DD x 0.7
2
V DD x 0.3
pF
V
V
Input Current
Input Current if Pullup is Activated
Drive Strength for Output Low
Level 2
Drive Strength for Output High
Level (GPIO1, GPIO2, GPIO3) 2
Drive Strength for Output High
Level (GPIO0) 2
Logic High Level Output Voltage
Logic Low Level Output Voltage
I IN
I INP
I OmaxLL
I OmaxLH
I OmaxHL
I OmaxHH
I OmaxLL
I OmaxLH
I OmaxHL
I OmaxHH
I OmaxLL
I OmaxLH
I OmaxHL
I OmaxHH
V OH
V OL
0 < V IN < V DD
V IL = 0 V
DRV[1:0] = LL
DRV[1:0] = LH
DRV[1:0] = HL
DRV[1:0] = HH
DRV[1:0] = LL
DRV[1:0] = LH
DRV[1:0] = HL
DRV[1:0] = HH
DRV[1:0] = LL
DRV[1:0] = LH
DRV[1:0] = HL
DRV[1:0] = HH
DRV[1:0] = HL
DRV[1:0] = HL
–10
1
V DD x 0.8
6.66
5.03
3.16
1.13
5.75
4.37
2.73
0.96
2.53
2.21
1.7
0.80
10
10
V DD x 0.2
μA
μA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
V
V
Notes:
1. All specifications guaranteed by qualification. Qualification test conditions are listed under “Qualification Test
Conditions” in "1.1. Definition of Test Conditions" on page 11.
2. GPIO output current measured at 3.3 VDC VDD with V OH = 2.64 VDC and V OL = 0.66 VDC.
Rev 1.1
9
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